Dresden 2014 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 55: Focussed Session: Towards a Quantitative Understanding of Complex Adsorption Structures: Surface Science goes Organic I

O 55.6: Vortrag

Mittwoch, 2. April 2014, 17:45–18:00, TRE Phy

High-precision LEED measurements of organic monolayers — •Falko Sojka, Julia Peuker, Tobias Huempfner, Matthias Meissner, Roman Forker, and Torsten Fritz — Friedrich Schiller University Jena, Institute of Solid State Physics, Max-Wien-Platz 1, 07743 Jena, Germany

Low energy electron diffraction (LEED) on epitaxial layers is a powerful tool to examine long-range ordering at the interface. Due to limitations like distortion of the LEED images, often additional efforts have to be made in order to derive precise epitaxial relations.[1, 2]

Due to our investigations of compensating geometric distortions and other systematic errors in LEED measurements we are able to perform high-precision determination of epitaxial growth and lattice constants. Therefore we analyzed diverse systems of organic monolayers on different substrates using e.g. coronene, hexa-peri-hexabenzocoronene (HBC), and quaterrylene (QT). Our results are partially in contrast to the literature. In our contribution we will also discuss results on organic heterostructures formed from two layers of dissimilar molecules.

In our case we are using two Double-MCP-LEED devices from Omicron and from OCI. These studies are supported by other methods like low temperature scanning tunneling microscopy (LT-STM) and differential reflectance spectroscopy (DRS) [3].
F. Sojka et al., Rev. Sci. Instrum. 84, 015111 (2013).
F. Sojka et al., Ultramicroscopy 133, 35-40 (2013).
R. Forker et al., Annu. Rep. Prog. Chem., Sect. C: Phys. Chem. 108, 34-68 (2012).