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O: Fachverband Oberflächenphysik

O 63: Posters: Scanning Probe Methods

O 63.28: Poster

Mittwoch, 2. April 2014, 17:30–21:00, P2

Solid State Sample Environment at the European XFEL — •Carsten Deiter, Oleksiy Drachenko, and Joachim Schulz — European X-Ray Free-Electron Laser Facility GmbH, Notkestr. 85, 22607 Hamburg, Germany

Free-electron lasers offer a variety of unique properties for spectroscopy and imaging. The combination of high peak brilliance and a high repetition rate opens a window to experiments that have not been feasible so far but also introduces challenges in sample preparation and refreshment, especially for solid state samples.

We present a concept and first prototype of a 10Hz sample changer opening the opportunity to expose every bunch train of the XFEL with its 2700 pulses to a new and virgin sample location, combined with temperature control, magnetic fields and optical pump lasers.