Dresden 2014 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 73: Scanning Probe Methods II
O 73.11: Vortrag
Donnerstag, 3. April 2014, 13:00–13:15, WIL A317
High-Resolution Imaging and nano-FTIR Spectroscopy using Synchrotron Radiation at the Metrology Light Source — •Peter Hermann1, Arne Hoehl1, Piotr Patoka2, Bernd Kästner1, Georg Ulrich2, Eckart Rühl2, Burkhard Beckhoff1, and Gerhard Ulm1 — 1Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany — 2Physikalische und Theoretische Chemie, Institut für Chemie und Biochemie, Freie Universität Berlin, Takustr. 3, 14195 Berlin, Germany
Infrared radiation provided by an electron storage ring can be regarded as an ideal source for spectroscopic applications since it is up to 1000 times brighter and covers a much broader spectral range than the radiation emitted from a conventional thermal light source. The achievable spatial resolution is, however, limited by diffraction, thus preventing a resolution below the diffraction limit. This limitation can be circumvented by using near-field approaches which are based on the use of a sharp metallic probe tip acting as a nano-scale light source when irradiated by a focused synchrotron radiation (SR) beam. In the following, we report on the use of broadband SR provided by the Metrology Light Source (MLS) for near-field imaging and acquisition of nano-FTIR spectra in a wide spectral range. By using SR for imaging of Si-based samples a spatial resolution below 50 nm can be achieved. The near-field signal detection in nano-FTIR measurements is confirmed by the acquisition of spectra from a SiC sample showing the characteristic strong phonon resonance near 927 cm-1. Additionally, further results obtained from various solid matter samples are presented.