Dresden 2014 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 73: Scanning Probe Methods II

O 73.1: Vortrag

Donnerstag, 3. April 2014, 10:30–10:45, WIL A317

Friction contrast in Dynamic Friction Force Microscopy — •Felix Mertens, Thomas Göddenhenrich, and André Schirmeisen — Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392 Gießen

Dynamic Friction Force Microscopy is a measuring technique for the investigation of friction properties on the nanometer scale. The off-resonance modulation of the sample excites bending oscillations of the cantilever if the tip is in contact with the sample surface. Contrast at surface steps and grain boundaries on HOPG demonstrate, that the third-harmonic lock-in detection is a selective method for the investigation of different tip-sample interactions. Furthermore, the signal on antimony nanoparticles shows the dependence on modulation amplitude and frequency for different materials as well as the influence caused by the particle topography.