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O: Fachverband Oberflächenphysik

O 73: Scanning Probe Methods II

O 73.9: Vortrag

Donnerstag, 3. April 2014, 12:30–12:45, WIL A317

A new low temperature near-field optical scanning microscope — •Julia Janik¹, Claudio Dal Savio², and Achim Hartschuh¹ — ¹Department Chemie and CeNS, LMU München, 81377 München, Germany — ²attocube systems AG, 80539 München, Germany

The characterisation of nanostructures with high spatial resolution and detection sensitivity can be achieved by tip-enhanced near-field optical microscopy (TENOM) [1]. Up to now nearly all TENOM measurements were performed at room temperature. Low temperature measurements on the other hand would reveal even more detailed information about material properties, for example due to reduced spectral broadening. We describe a new scheme for implementing TENOM at low temperatures. For initial experiments and testing well known quasi 1D semiconducting model systems such as single-walled carbon nanotubes (SWCNT) and cadmium selenide (CdSe) nanowires were used [2]. Here we describe our efforts and first results on our way towards low temperature near-field optical microscopy.

We acknowledge financial support by NIM and the ERC (NewNanoSpec).

[1] N. Mauser and A. Hartschuh, Chem. Soc. Rev., DOI: 10.1039/C3CS60258C (2014)

[2] M. Böhmler et al., Angew. Chem. Int. Ed. 50, 11536 (2011)