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10:30 |
O 73.1 |
Friction contrast in Dynamic Friction Force Microscopy — •Felix Mertens, Thomas Göddenhenrich, and André Schirmeisen
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10:45 |
O 73.2 |
Artifacts in combined STM/AFM due to non-ideal ground in an STM pre-amplifier — •Nirmalesh Kumar Sampath Kumar, Alfred John Weymouth, and Franz Josef Giessibl
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11:00 |
O 73.3 |
Dynamic local work function measurement and the role of topography — •Ferdinand Huber, Sonia Matencio, Alfred J. Weymouth, and Franz J. Giessibl
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11:15 |
O 73.4 |
The STM as Microwave resonator: Josephson currents interacting with the environment — •Berthold Jäck, Matthias Eltschka, Maximilian Assig, Markus Etzkorn, Christian R. Ast, and Klaus Kern
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11:30 |
O 73.5 |
The Zeeman Effect in dimensionally confined, superconducting STM tips — •C. R. Ast, M. Eltschka, B. Jäck, M. Assig, M. Etzkorn, O. V. Kondrashov, M. A. Skvortsov, and K. Kern
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11:45 |
O 73.6 |
Multi-Tip STM / Nanoprober for electrical characterization at the nanoscale — •Bert Voigtländer, Vasily Cherepanov, Peter Coenen, Stefan Korte, Marcus Blab, and Hubertus Junker
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12:00 |
O 73.7 |
Atomically resolved STM imaging with a single-crystal diamond tip — Vladimir I. Grushko, •Olaf Lübben, Alexander N. Chaika, Nikolay V. Novikov, Evgeniy I. Mitskevich, A. P. Chepugov, Oleg G. Lysenko, Barry E. Murphy, Sergey A. Krasnikov, and Igor V. Shvets
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12:15 |
O 73.8 |
STM imaging of HOPG: Tip geometry effects — •Gábor Mándi, Gilberto Teobaldi, and Krisztián Palotás
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12:30 |
O 73.9 |
A new low temperature near-field optical scanning microscope — •Julia Janik, Claudio Dal Savio, and Achim Hartschuh
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12:45 |
O 73.10 |
Secondary Electron Analysis with Topografiner Technology — •Lorenzo G. De Pietro, Danilo A. Zanin, Hugo Cabrera, Mehmet Erbudak, Andreas Fognini, Thomas U. Michlmayr, Yves M. Acremann, Danilo Pescia, and Urs Ramsperger
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13:00 |
O 73.11 |
High-Resolution Imaging and nano-FTIR Spectroscopy using Synchrotron Radiation at the Metrology Light Source — •Peter Hermann, Arne Hoehl, Piotr Patoka, Bernd Kästner, Georg Ulrich, Eckart Rühl, Burkhard Beckhoff, and Gerhard Ulm
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