Dresden 2014 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 99: Scanning Probe Methods III
O 99.2: Vortrag
Freitag, 4. April 2014, 10:45–11:00, GER 38
Magnetic force microscopy sensors with multi-component stray field sensitivity — •Christopher Friedrich Reiche1, Silvia Vock1, Bernd Büchner1,2, and Thomas Mühl1 — 1Leibniz-Institut für Festköper- und Werkstoffforschung IFW Dresden — 2Institut für Festkörperphysik, Technische Universität Dresden
Magnetic force microscopy (MFM) is a powerful tool for mapping the spatial distribution of one component of a magnetic stray field gradient. We employ iron filled carbon nanotubes as monopole-like magnetic tips [1] for quantitative MFM. Our advanced sensor design enables us to consecutively perform quantitative measurements of one in-plane and the out-of-plane stray field component with the same sensor [2]. By developing novel sensor concepts we not only improve the in-plane sensitivity of our sensors but also expand their scope of application. Furthermore, we investigate the applicability of our sensors to general scanning force microscopy methods.
[1] F. Wolny, T. Mühl, U. Weissker, K. Lipert, J. Schumann, A. Leonhardt, and B. Büchner, Nanotechnology 21, 435501 (2010)
[2] T. Mühl, J. Körner, S. Philippi, C. F. Reiche, A. Leonhardt, and B. Büchner, Appl. Phys. Lett. 101, 112401 (2012)