Dresden 2014 – wissenschaftliches Programm

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TT: Fachverband Tiefe Temperaturen

TT 29: Graphene: Structural Properties (organized by O)

TT 29.4: Vortrag

Montag, 31. März 2014, 16:45–17:00, WIL C107

Back Focal Plane Imaging of Raman Scattering from Graphene — •Harald Budde, Xian Shi, Nicolai Hartmann, and Achim Hartschuh — Department Chemie und CeNS, LMU München, Germany

Raman Scattering Spectroscopy is a powerful technique for studying graphene and other sp2 carbon materials [1]. We combined Raman Spectroscopy with back focal plane (BFP) imaging , a method used to visualize the angular distribution of emitted or scattered light. As an example BFP imaging allows to determine the orientation of single dipolar emitters [2, 3]. For graphene on glass Raman BFP images mainly reflect the polarization characteristics of the different phonon modes. On thin gold films emission from graphene leads to the excitation of propagating surface plasmon polaritons.

[1] A. Ferrari, D. Basko, Nat. Nanotech 8, 235-246, 2013.

[2] M. Lieb, J. Zavislan, L. Novotny, J. Opt. Soc. Am. B 21, 1210-1215, 2004.

[3] N. Hartmann, G. Piredda, J. Berthelot, G. Colas des Francs, A. Bouhelier, A. Hartschuh, Nano Lett. 12, 177-181, 2012.