Dresden 2014 – scientific programme
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TT: Fachverband Tiefe Temperaturen
TT 80: Low-Dimensional Systems - Poster Session
TT 80.16: Poster
Wednesday, April 2, 2014, 15:00–19:00, P2
Statistical properties of the charge-carrier dynamics at the Mott critical endpoint in κ-(BEDT-TTF)2X-Salts — •David Zielke1, Benedikt Hartmann1, Jana Polzin1, Robert Rommel1, John A. Schlueter2, Takahiko Sasaki3, and Jens Müller1 — 1Institute of Physics, Goethe University Frankfurt, Germany — 2Materials Science Division, Argonne National Laboratory, Argonne, IL, USA — 3Institute for Materials Research, Tohoku University, Sendai, Japan
The quasi-2D organic charge-transfer salts κ-(ET)2X are considered as model systems for studying the Mott metal-insulator transition (MIT) in reduced dimensions. We investigated partially deuterated κ-[(H8-ET)0.2(D8-ET)0.8]2Cu[N(CN)2]Br, which can be reversibly tuned through the critical region in the generalized phase diagram by employing different cooling rates which has a crucial effect on the ratio of bandwith W to on-site Coulomb repulsion U. On this poster, we describe our statistical analysis of the resistance fluctuations by means of time-resolved transport measurements in the vicinity of the finite-T critical endpoint (p0,T0). Utilizing a fast data acquisition card in combination with a self-written software we derive the resistance noise power spectral density and higher-order statistical moments (second spectrum). At T0, we observe a drastic enhancement and slowing down of the low-frequency resistance fluctuations for certain cooling rates together with a frequency dependent signature in the second spectrum. We interpret our observations in terms of a glassy electronic system possibly being universal for MITs.