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HK: Fachverband Physik der Hadronen und Kerne
HK 34: Instrumentierung
HK 34.3: Vortrag
Mittwoch, 19. März 2014, 17:30–17:45, HZ 8
Characterization of silicon microstrip sensors with a pulsed infrared laser system for the CBM experiment at FAIR — •Pradeep Ghosh1,2 and Juergen Eschke2,3 for the CBM collaboration — 1Goethe Univ., Frankfurt — 2GSI — 3FAIR
The Silicon Tracking System (STS) for the Compressed Baryonic Matter (CBM) experiment at FAIR will comprise more than 1200 double-sided silicon microstrip sensors. For the quality assurance of the prototype sensors a laser test system has been built up. The aim of the sensor scans with the pulsed infrared laser system is to determine the charge sharing between strips and to measure the uniformity of the sensor response over the whole active area. The laser system measures the sensor response in an automatized procedure at several thousand positions across the sensor with focused infrared laser light (σ ≈15 µm, λ = 1060 nm). The duration (5 ns) and power (few mW) of the laser pulses are selected such, that the absorption of the laser light in the 300 µm thick silicon sensors produces a number of about 24k electrons, which is similar to the charge created by minimum ionizing particles in these sensors. Results from the characterization of monolithic active pixel sensors, to understand the spot-size of the laser, and laser scans for different sensors will be presented.
Supported by Helmholtz International Center for FAIR, HGS-HIRe and H-QM.