DPG Phi
Verhandlungen
Verhandlungen
DPG

Berlin 2015 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

CPP: Fachverband Chemische Physik und Polymerphysik

CPP 15: P1: Interfaces and Thin Films

CPP 15.7: Poster

Monday, March 16, 2015, 16:00–19:00, Poster A

Accurate Refractive-Index Determination from First- and Second-Order Critical Angles of Periodic Surface Patterns — •Christoph Meichner1, Lothar Kador1, Andreas Schedl2, Hans-Werner Schmidt2, Christian Neuber2, and Klaus Kreger21University of Bayreuth, Institute of Physics and Bayreuth Institute of Macromolecular Research (BIMF), 95440 Bayreuth, Germany — 2University of Bayreuth, Macromolecular Chemistry I and Bayreuth Institute of Macromolecular Research (BIMF), 95440 Bayreuth, Germany

We present a novel method for the determination of the refractive-index dispersion of transparent solid films. The approach is based on irradiating collimated monochromatic light onto the sample with the illuminated spot carrying a periodic surface pattern. A simple rotational stage is sufficient for measuring critical angles of the light propagating in the film. From these angles, the refractive indices are calculated. To study the accuracy of our method, we prepared samples of a PDMS cast resin (Sylgard® 184) and compared the results to those obtained with an Abbe refractometer. The data are in good agreement, considering the angular resolution of the stage and the precision of the grating constant.

100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2015 > Berlin