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DS: Fachverband Dünne Schichten

DS 2: Thin Film Characterisation I: Structure Analysis and Composition

DS 2.12: Vortrag

Montag, 16. März 2015, 12:30–12:45, H 0111

GISAXS investigation of growth of Ag nanoparticles from atomic deposition: experiment and simulation — Celine Durniak, •Marina Ganeva, Gennady Pospelov, Walter Van Herck, and Joachim Wuttke — Jülich Centre for Neutron Science, Forschungszentrum Jülich, Outstation at MLZ, Garching, Germany

Grazing-Incidence Small-Angle X-ray Scattering (GISAXS) is a powerful tool for the investigation of the growth of noble metal particles on various substrates. Understanding of the underlying growth mechanisms allows for a control of the properties of the nanocoatings. Due to the complexity of the GISAXS data analysis, appropriate software is required to deduce the structural information from the measured GISAXS pattern. Here we present our software BornAgain [1]. BornAgain is a multi-platform open-source project that aims at supporting scientists in the analysis and fitting of their GISAS data, both for synchrotron (GISAXS) and neutron (GISANS) facilities. As a case study, the growth of Ag nanoparticles on Si and PTFE substrates during DC magnetron sputtering of Ag is taken. The GISAXS investigation of structural properties was performed at the high-resolution diffractometer GALAXI (Jülich).

[1] http://bornagainproject.org