Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 36: Poster Session I

DS 36.35: Poster

Donnerstag, 19. März 2015, 09:30–12:00, Poster A

RHEED-based investigations of (La2/3Sr1/3)xMnyOz thin film growth — •Alexandra Steffen¹, Sabine Pütter¹, Jürgen Schubert³, Stefan Mattauch¹, Willi Zander³, Stefan Geprägs⁴, and Thomas Brückel^1,2 — ¹Jülich Centre for Neutron Science JCNS, Forschungszentrum Jülich GmbH, Outstation at MLZ, Lichtenbergstr. 1, 85748 Garching — ²Jülich Centre for Neutron Science JCNS und Peter Grünberg Institut PGI, JCNS-2, PGI-4: Scattering Methods, Forschungszentrum Jülich GmbH, 52425 Jülich — ³Peter Grünberg Institut PGI, PGI-9: Semiconductor Nanoelectronics, Forschungszentrum Jülich GmbH, 52425 Jülich — ⁴Walther-Meißner-Institut, Bayerische Akademie der Wissenschaften, 85748 Garching

In transition metal oxide thin films the Ruddlesden-Popper variants of classical perovskite materials are under intense investigation [1]. Here, we focus on a comparison of the relation between two different growth techniques onto in-situ Reflection of High-Energy Electron Diffraction (RHEED) measurements [2] of ferromagnetic (La_2/3Sr_1/3)_xMn_yO_z. Semi-continuous deposition and atomic-layer-by-layer deposition was realized via oxide Molecular Beam Epitaxy. Control of the stoichiometry was monitored in-situ via quartz crystal balance and RHEED and ex-situ via Rutherford Backscattering Spectrometry (RBS). Via additional XRR, XRD and PNR measurements we combine different scattering methods to gain insight into the depth profile of the atomic positions. [1] V. Goian et al., Phys. Rev. B 90, 174105 (2014); [2] J. Haeni et al., Journal of Electroceramics 4, 385 (2000)