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Berlin 2015 – scientific programme

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DS: Fachverband Dünne Schichten

DS 36: Poster Session I

DS 36.46: Poster

Thursday, March 19, 2015, 09:30–12:00, Poster A

Analysis of island shape evolution from diffuse x-ray scattering/GISAXS of organic thin films and implications for growthChristian Frank1, •Rupak Banerjee1, Martin Oettel1, Alexander Gerlach1, Jiří Novák1,2, Gonzalo Santoro3, and Frank Schreiber11Institut für Angewandte Physik, Universität Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany — 2Central European Institute of Technology, Masaryk University, Kamenice 5, CZ-62500 Brno, Czech Republic — 3Photon Science, DESY, Notkestr. 85, 22607 Hamburg, Germany

Understanding the growth of organic semi-conducting molecules with shape anisotropy is of high relevance to the processing of optoelectronic devices. This work provides insight into the growth of thin films of the prototypical rodlike organic semiconductor diindenoperylene on a microscopic level, by analyzing in detail the film morphology. We model our data, which were obtained by high-resolution grazing incidence small angle x-ray scattering (GISAXS), using a theoretical description from small angle scattering theory derived for simple liquids. Based on form factor calculations for different object types we determine how the island shapes change in the respective layers [1]. Atomic force microscopy measurements approve our findings.

[1] C. Frank et al. Phys. Rev. B 90, 205401 (2014).

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