Berlin 2015 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 36: Poster Session I

DS 36.50: Poster

Donnerstag, 19. März 2015, 09:30–12:00, Poster A

Ion beam analysis of defects in irradiated lithium niobate — •Gregor Becker, Konrad Ritter, Emanuel Schmidt, and Elke Wendler — Institut für Festkörperphysik, Jena, Deutschland

In this presentation ion implanted lithium niobate is investigated applying Rutherford backscattering spectrometry (RBS) in channeling configuration. It is commonly known that the measured defect concentration exhibits a different visibility in x- and z-cut lithium niobate. Generally, this effect has been attributed to the preferred location of displaced niobium atoms at vacant octahedral sites. However, the influence of the implantation for the differently orientated substrates could not be ruled out. Therefore in our investigations lithium niobate samples were used which where cut 45 degrees to the x- and z-direction, respectively. In this case the damage concentration could be measured in both x- and z-direction on one and the same sample. Our results reproduce those obtained from x- and z-cut samples. This proves the assumption that displaced niobium atoms occupy free octahedral sites. Applying RBS only the niobium sublattice can be investigated. Therefore an attempt is made to use nuclear reaction analysis (NRA) for studying the lithium sublattice. For that the Li(p,α₀)He reaction is examined. Measurements of the cross-section of this reaction under the given experimental conditions allow for estimates of the depth resolution and the lower detection limit. First results for damage studies with NRA will be presented.