Berlin 2015 – scientific programme
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DS: Fachverband Dünne Schichten
DS 36: Poster Session I
DS 36.54: Poster
Thursday, March 19, 2015, 09:30–12:00, Poster A
critical current density scaling of FeSe0.5Te0.5 thin films on different substrates — •Feifei Yuan1,2, Kazumasa Iida2,3, Marco Langer2, Jens Hänisch2, Ataru Ichinose4, Ichiro Tsukada4, Alberto Sala5, Marina Putti5, Ruben Hühne2, Ludwing Schultz2, and Zhixiang Shi1 — 1Department of Physics and Key Laboratory of MEMS of the Ministry of Education, Southeast University, Nanjing, China — 2Institute for Metallic Materials, IFW Dresden, Dresden, Germany — 3Department of Crystalline Materials Science Graduate School of Engineering, Nagoya University, Nagoya, Japan — 4Central Research Institute of Electric Power Industry, 2-6-1 Nagasaka, Yokosuka, Kanagawa, Japan — 5Dipartimento di Fisica, Università di Genova, Via Dodecaneso, Genova, ItalyI
FeSe0.5Te0.5 thin films grown by pulsed laser deposition on CaF2, LaAlO3 (LAO) and MgO substrates were structurally and electro-magnetically characterized. The in-plane lattice mismatch between FeSe0.5Te0.5 and the substrates shows no influence on the lattice parameters of the films. While the type of the substrates, crystallinity and epitaxy of the films affect the superconducting properties. The film on MgO showed an extra peak in the angular dependence of Jc at θ=180°, which arises from c-axis defects as confirmed by transmission election microscopy. In contrast, no c-axis Jc(θ) peaks were observed in films on CaF2 and LAO. A successful scaling of the Jc(θ) can be realized for both films without c-axis correlated defects by the anisotropy ginzburg-landau (AGL)approach with appropriate anisotropy ratio γ.the AGL scaling parameter γ is decreasing with decreasing temperature.