DPG Phi
Verhandlungen
Verhandlungen
DPG

Berlin 2015 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 39: Poster Session II

DS 39.16: Poster

Donnerstag, 19. März 2015, 16:00–18:30, Poster F

Investigation of the metallization of P(VDF-TrFE) with gold by RF-sputter deposition — •Alexander Hinz1, Oleksandr Polonskyi1, Matthias Schwartzkopf2, Gonzalo Santoro2, Ezzeldin Metwalli3, Yuan Yao3, Thomas Strunskus1, Franz Faupel1, Stephan V. Roth2, and Peter Müller-Buschbaum31CAU zu Kiel, Kaiserstr. 2, 24143 Kiel — 2DESY, Notkestr. 85, 22607 Hamburg — 3TU München, Physik-Department, LS Funktionelle Materialien ,James-Franck-Str. 1, 85748 Garching

Although it is well established in industry and important for many applications the sputter deposition of metals onto organic surfaces is yet to be completely understood. Due to the inherent complexity (e.g. bombardment of the organic surfaces by energetic ions) of the sputtering process the basic mechanisms determining the final microstructure are still to be identified. The complexity of sputter deposition and the post-deposition changes which are to be expected necessitate the use of in-situ methods. In-situ grazing incidence small angle scattering (GISAXS) has been used to extract structural information with high spatial and temporal resolution from a growing Au-film deposited via RF-sputter deposition onto a P(VDF-TrFE)-film. The Au-P(VDF-TrFE) system has been chosen as a model system of a relatively inert metal-polymer pair. Analysis of the GISAXS data yields information about the morphology of the growing Au-film. Comparing these results to simulated scattering data provides further information about the basic growth mechanisms acting at different stages of the growth of the metal film.

100% | Mobil-Ansicht | English Version | Kontakt/Impressum/Datenschutz
DPG-Physik > DPG-Verhandlungen > 2015 > Berlin