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DS: Fachverband Dünne Schichten

DS 39: Poster Session II

DS 39.26: Poster

Donnerstag, 19. März 2015, 16:00–18:30, Poster F

Nanospectroscopic studies in organic thin film devices — •Xiaoyan Du¹, Benedikt Rösner¹, Peter Warnicke², Xuechen Jiao³, Tayebeh Ameri⁴, and Rainer Fink¹ — ¹Physikalische Chemie II, FAU Erlangen-Nürnberg, 91058 Erlangen, Germany — ²Paul-Scherrer-Institut, Villigen, Schweiz — ³Department of Physics, NCSU, Raleigh, North Carolina 27695-8202, USA — ⁴FAU Erlangen-Nürnberg, Institute of Materials for Electronics and Energy Technology (I-MEET), Germany

The performance of organic thin film devices are greatly dependent on the morphology of the active layer.Combining Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM) and chemical sensitive methods like Scanning Transmission X-ray Microscopy (STXM) and Resonant Soft X-ray Scattering (RSoXS) can enable us to gain a better understanding of the structure-performance relationship on the nanometer scale. Combining these techniques,we were able to correlate the organic field effect transistor properties of thin films of 6,13-Dihydro-6,13-diazapentacene (DHDAP)with the film morphology which is influenced by the deposition temperature. While STXM is particularly suited to monitor the molecular orientations locally, AFM indicates crystallinity smaller than the oriented domains. STXM, RSoXS and TEM were combined to study active layer morphology of ternary organic solar cells. Our results clearly showed that the miscibility between polymers and fullerenes is a key factor in determining the functionality of ternary solar cells. The structure findings correlate with the device performance.