Berlin 2015 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 61: Posters III (Organic-inorganic perovskite semiconductors; Organic photovoltaics and electronics; Photovoltaics; Energy science; New materials and concepts)
HL 61.28: Poster
Wednesday, March 18, 2015, 15:00–20:00, Poster F
Imaging the electric potential distribution of thin film solar cells — •Michael Scherer1,2, Robert Lovrincic1,2, and Wolfgang Kowalsky1,2 — 1InnovationLab GmbH, Heidelberg — 2TU Braunschweig, Institut für Hochfrequenztechnik, Braunschweig
Huge research efforts on second to fourth generation solar cells lead to a tremendous growth in the power conversion efficiency of thin film solar cells, competing silicon based photovoltaics.
Charge generation and transport in these devices occur in layered stacks containing thin films of different functional materials. Because of layer thicknesses on the nano- to microscale, a complex interplay of interface and bulk effects determines the performance of the devices. This interplay can hardly be predicted from simulations or interface experiments only, highlighting the role of cross-sectional studies with high lateral resolution. We perform a correlated scanning Kelvin probe microscopy (SKPM) and electron beam induced current (EBIC) study on solar cell cross sections to image the electronic properties of entire solar cell devices.
Our scanning probe station is placed within the vacuum of a combined scanning electron microscopy (SEM)/focused ion beam (FIB) cross beam system. We prepare cross sections of different types of solar cells and characterize them with SKPM and EBIC on the same spot. The samples are illuminated and contacted in a defined manner and studied in vivo within the vacuum of our cross beam station.