Berlin 2015 – wissenschaftliches Programm
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KR: Fachgruppe Kristallographie
KR 2: Poster Crystallography
KR 2.3: Poster
Montag, 16. März 2015, 19:00–21:00, Poster C
Application of polychromatic X-ray Laue diffraction for the analysis of dislocation structures using a PNCCD — •Ali Abboud1, Sebastian Send1, Ullrich Pietsch1, Christoph Kirchlechner2, Lothar Strüder4, Jean Sebastian Micha5, and Jozef Keckes3 — 1Department of Physics, University of Siegen, Siegen, 57072, Germany — 2Max Planck Institut für Eisenforschung GmbH, Max-Planck-Str.1, 40237 Düsseldorf, Germany — 3Montanuniversität Leoben, Leoben, 8700, Austria — 4PNSensor GmbH, Munich, 80803, Germany — 5CEA-Grenoble/DRFMC/SprAM, 17 rue des Martyrs, Grenoble Cedex 9, F-38054, France
uLaue diffraction with a polychromatic X-ray beam can be used to measure strain fields and crystal orientations of micro crystals. In the vicinity of a Bragg reflection the intensity distribution of the reciprocal space is sensitive to the distribution and type of dislocations. By using a pnCCD, the energy and the 2D intensity distribution of the Bragg reflections can be measure simultaneously. This allows to obtain the hydrostatic strain and the deviatoric strain tensors. We present an application of white beam uLaue X-ray diffraction on a bent Copper crystal to measure local strain along the bending beam by using a PNCCD detector.