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MA: Fachverband Magnetismus
MA 19: POSTER Ia
MA 19.28: Poster
Dienstag, 17. März 2015, 09:30–13:00, Poster A
Lifetime measurements for CoFeB/MgO/CoFeB tunneling junctions — •Andres Conca1, Frederick Casper2,3, Johannes Paul4, Ronald Lehndorff4, Mathias Kläui3, Britta Leven1, and Burkard Hillebrands1 — 1FB Physik und Landesforschungszentrum OPTIMAS, TU Kaiserslautern, 67663 Kaiserslautern, Germany — 2Institute of Inorganic and Analytical Chemistry, Johannes Gutenberg-Universitaet Mainz, 55099 Mainz, Germany — 3Institute of Physics, Johannes Gutenberg-Universitaet Mainz, 55099 Mainz, Germany — 4Sensitec GmbH, Hechtsheimer Str. 2, 55131 Mainz, Germany
An analysis of the lifetime of TMR elements using the Weibull statistical distribution is presented. The distribution is governed by two parameters, the characteristic lifetime η and the shape parameter β, which gives information about the presence of an infant mortality in the population. First of all, the suitability of the Weibull distribution for the description of breakdown processes in MgO-based tunneling junctions at different voltages is proven. Secondly, a study of the dependency of the characteristic lifetime extrapolated to the low voltage regime, and the parameter on the nominal barrier thickness, the RA product and the deposition power for the MgO barrier is shown. Finally, a discussion of the absolute overall values and the dependencies and the suitability of the elements for sensor production is given.
Support by the state of Rhineland-Palatinate (MBWWK and MWKEL) and by the ERDF programm in the frame of the Spintronic Technology Platform (STeP) is gratefully acknowledged.