Berlin 2015 – scientific programme
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MA: Fachverband Magnetismus
MA 19: POSTER Ia
MA 19.65: Poster
Tuesday, March 17, 2015, 09:30–13:00, Poster A
Structural and magnetic properties of epitaxially grown Fe/Cu multilayers — •Amir Syed Mohd1, Sabine Pütter1, Stefan Mattauch1, Alexandros Koutsioubas1, Stephan Geprägs2, and Thomas Brückel1,3 — 1Jülich Centre for Neutron Science JCNS, Forschungszentrum Jülich GmbH, Outstation at MLZ, 85747 Garching, Germany — 2Walther-Meißner-Institut, Bayerische Akademie der Wissenschaften, 85748 Garching, Germany — 3Jülich Centre for Neutron Science JCNS and Peter Grünberg Institute, JCNS-2, PGI-4: Scattering Methods, Forschungszentrum Jülich GmbH, 52428 Jülich, Germany
Alternate magnetic layers separated by non-magnetic layers are known for exhibiting interlayer coupling and its applications in memory devices. Fe/Cu multilayers are interesting to study because the lattice spacing and the crystal structure of Fe layer vary with thickness which may lead to change in magnetic ordering.
In this work we have deposited [Fe(x)/Cu(y)]x10 multilayers with Fe layer thickness of x (~1.5, 2.0 and 2.5 nm) and corresponding Cu layer thickness of y (~2.5, 2.0 and 1.5 nm), on Cu (100) buffer layer epitaxially grown on Si (100) substrate at ~280 K using MBE. In-situ RHEED measurements were performed to monitor the epitaxial growth during deposition. SQUID measurements suggest that the interlayer coupling is increasing with decreasing Fe layer thickness. Further, in order to determine depth dependent magnetization profile, polarized neutron reflectivity measurements are underway. The obtained results will be discussed in this presentation.