Berlin 2015 – scientific programme

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MA: Fachverband Magnetismus

MA 49: POSTER II

MA 49.11: Poster

Thursday, March 19, 2015, 15:00–18:00, Poster A

Enhancement of the Magneto-optical Kerr effect using Si capping layers — •Nicolas David Mueglich and Arno Ehresmann — Department of Physics and Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Str. 40, D-34132 Kassel

Investigations on the enhancement of the longitudinal Magneto-optical Kerr effect with amorphous silicon capping layers^[1] are shown for different exchange bias multilayer systems. The Kerr Amplitude, as the fundamental material property defining the achievable signal-to-noise ratio in magneto-optical readout measurements, was measured for the magnetic materials Ni₈₀Fe₂₀, Co₇₀Fe₃₀ and Co in dependence of angle and polarization of the incident light and the thickness of the silicon capping layer. The results were compared to calculations using the 4x4 transfer matrix method. Strong enhancement of the Kerr Amplitude for certain combinations of the silicon layer thickness and the angle of incidence can be achieved and may be used to tailor magnetic layer systems with maximized contrast in magneto-optical read out measurements.
Nakamura, K.; Asaka, T.; Asari, S.; Ota, Y.; Itoh, A., Enhancement of Kerr rotation with amorphous Si film, Magnetics, IEEE Transactions on , vol.21, no.5, pp.1654,1656, Sep 1985, doi: 10.1109/TMAG.1985.1063911