Berlin 2015 – scientific programme
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MA: Fachverband Magnetismus
MA 54: Magnetic Coupling Phenomena
MA 54.3: Talk
Friday, March 20, 2015, 10:00–10:15, EB 301
Light-ion bombardment induced magnetic patterning (IBMP) of exchange bias layer systems by He-ion microscope — •Alexander Gaul1, Daniel Emmrich2, André Beyer2, Johanna Hackl3, Hatice Doganay3, Timo Kuschel4, Andreas Hütten4, Günter Reiss4, Slavo Nemsak3, Armin Gölzhäuser2, and Arno Ehresmann1 — 1Department of Physics & CINSaT, University of Kassel — 2Physics of Supramolecular Systems and Surfaces, University of Bielefeld — 3PGI-6, FZ-Jülich — 4Thin Films & Physics of Nanostructures, University of Bielefeld
Light-ion bombardment induced magnetic patterning (IBMP) of exchange bias (EB) bilayer systems by Helium ion bombardment through a shadow mask is a well known technique to tailor the magnetic anisotropy locally on the micrometer scale. Here we show the use of a Helium ion microscope (HIM) to create complex magnetic patterns in EB systems without masks. In this way lateral dimensions of the magnetic patterns down to a few tenths of a nanometer become feasible and experimetns to investigate the ultimate resolution limit of IBMP are at hand. Therefore designed patterns were written by a He-ion beam of 10~nm diameter in the EB layer. The influence of size and shape on magnetic domain walls within one sample has been analyzed by magnetic force microscopy (MFM) to detect changes in the domain wall charge distribution and by x-ray magnetic circular dichroism photoemission electron microscopy (XMCD-PEEM) to get a detailed information about the magnetization orientation within the domains and domain walls.