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15:00 |
MI 10.1 |
Ion Beam Analysis in a Helium Ion Microscope — •Nico Klingner, René Heller, Gregor Hlawacek, Stefan Facsko, and Johannes von Borany
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15:00 |
MI 10.2 |
Investigating Atomic Contrast in Atomic Force Microscopy and Kelvin Probe Force Microscopy on Ionic Systems using Functionalized Tips — •Leo Gross, Bruno Schuler, Fabian Mohn, Nikolaj Moll, Niko Pavliček, Wolfram Stuerer, Ivan Scivetti, Konstantinos Kotsis, Mats Persson, and Gerhard Meyer
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15:00 |
MI 10.3 |
Material sensitive coherent diffractive imaging employing a gas discharge plasma EUV source and phase grating for wavelength selection — •Raoul Bresenitz, Jan Bußmann, Denis Rudolf, Michal Odstrcil, Detlev Grützmacher, and Larissa Juschkin
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15:00 |
MI 10.4 |
CUDA Accelerated Framework for Phase Reconstruction in X-ray Imaging Using SciPAL — •Johannes Hagemann, Stephan Kramer, and Tim Salditt
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15:00 |
MI 10.5 |
Sparsity Constraint for Phase Retrieval in X-Ray Imaging — •Anne Pein and Tim Salditt
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15:00 |
MI 10.6 |
Femtosecond speckle and coherence experiments at the CHG short-pulse facility at DELTA — •Christian Gutt, Mario Reiser, Sebastian Warsow, Tushar Sant, Svenja Hilbrich, Maryam Huck, Shaukat Khan, Markus Höner, Carsten Mai, Arne Meyer auf der Heide, Robert Molo, Helge Rast, and Peter Ungelenk
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15:00 |
MI 10.7 |
Chaotic behavior in ASAXS formalisms — •Sören Gayer, Ulla Vainio, and Andreas Schreyer
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15:00 |
MI 10.8 |
The dependency of an EBSD detectors exposure on electron beam current and primary energy — •Susanne Wolff, Michael Hietschold, Steffen Schulze, and Nathanael Jöhrmann
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15:00 |
MI 10.9 |
Determination of the refractive index of casein micelles — •Sabrina Kröner, Steffen Nothelfer, Florian Foschum, and Alwin Kienle
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