MI 2: Analytical Transmission Electron Microscopy and Atom Probe Tomography
Montag, 16. März 2015, 12:00–13:15, EMH 225
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12:00 |
MI 2.1 |
Imaging Phase Transition of LiMn2O4 Nanowire Battery by in-situ TEM — •Soyeon Lee, Yoshifumi Oshima, and Kunio Takayanagi
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12:15 |
MI 2.2 |
In-situ Transmission Electron Microscopy Study of Ge(8- n)Sn(n)Sb2Te11 — Dietrich Häußler, •Torben Dankwort, Lorenz Kienle, Christine Koch, Wolfgang Bensch, and David C. Johnson
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12:30 |
MI 2.3 |
Exploring the properties of individual nanomagnets: EMCD on FePt nanocubes — •Sebastian Schneider, Darius Pohl, Thomas Schachinger, Stefan Löffler, Peter Schattschneider, and Bernd Rellinghaus
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12:45 |
MI 2.4 |
How electrostatic simulations improve the understanding of APT measurement results — •Christian Oberdorfer, Daniel Beinke, and Guido Schmitz
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13:00 |
MI 2.5 |
Accurate volume reconstruction by numerical calculation of trajectories — •Daniel Beinke, Christian Oberdorfer, and Guido Schmitz
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