Berlin 2015 – scientific programme

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MI: Fachverband Mikrosonden

MI 3: Analytical Scanning Electron Microscopy

MI 3.1: Invited Talk

Monday, March 16, 2015, 15:00–15:45, EMH 225

Orientations, texture, properties - applications of electron backscatter diffraction — •Karsten Kunze — ScopeM, ETH Zürich, Switzerland

Electron Backscatter Diffraction (EBSD) is the most widespread method for crystallographic characterisation at the microscale in the scanning electron microscope (SEM). The EBSD pattern contains information about the crystallographic phase and orientation as well as on the defect content of the material. Automated acquisition and analysis of EBSD patterns allows to map crystal orientations and phases, intergranular and intragranular microstructures, grain boundary misorientations, all at size scales between some ten nanometers to some ten millimeters. Crystallographic preferred orientations (CPO or texture) give rise to anisotropy in bulk tensorial properties. The presentation will review some of the recent developments with applications in Earth and materials sciences.