Berlin 2015 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 3: Analytical Scanning Electron Microscopy

MI 3.4: Vortrag

Montag, 16. März 2015, 16:15–16:30, EMH 225

Detecting the chemical shift of X-ray lines of Lithium, Boron and Carbon using a novel wave-length dispersive X-ray spectrometer — •Jürgen Heindl — JEOL (Germany) GmbH; Oskar-v.-Miller-Str. 1a; 85386 Eching; Deutschland

A novel parallel detecting wave-length dispersive x-ray spectrometer was developed by JEOL Ltd. Tokyo, Japan. This Soft X-ray Emission Spectrometer (SXES) is sensitive to extreme soft X-ray like the Li-K-line and opens access to qualitative as well as quantitative analysis of Li-alloys and Li-ion batteries e.g. The energy resolution of this spectrometer is high enough to observe the line shift induced by different chemical environment of the individual element (chemical shift) as well as the line shape of selected x-ray lines.

Recent application examples will be shown of Li quantification, the chemical shift of B-K- and C-K-line and the chemical dependency of the line shape of the Si-L-line in different Si compositions.