MI 6: Scanning Probe Microscopy
Dienstag, 17. März 2015, 11:30–12:00, EMH 225
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11:30 |
MI 6.1 |
The ReactorAFM: a high-pressure high-temperature NC-AFM for catalysis — Sander B. Roobol, •Matthijs A. van Spronsen, Mirthe Bergman, Peter C. van der Tuijn, Raymond C.T. Koehler, Joost W.M. Frenken, and Irene M.N. Groot
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11:45 |
MI 6.2 |
Multifrequency AFM with Self-sensing Tunneling Magnetoresistive (TMR) Cantilevers — •Gerald Göring, Tobias Meier, Alexander Förste, Ali Tavassolizadeh, Karsten Rott, Dirk Meyners, Roland Gröger, Günter Reiss, Eckhard Quandt, Thomas Schimmel, and Hendrik Hölscher
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