Berlin 2015 – scientific programme
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MI: Fachverband Mikrosonden
MI 7: X-ray Imaging, Tomography and X-ray Optics
MI 7.1: Talk
Wednesday, March 18, 2015, 09:30–09:45, EMH 225
XFEL nanobeam characterization by scanning coherent x-ray microscopy — •Andreas Schropp1, Robert Hoppe2, Jens Patommel2, Frank Seiboth2, Hae Ja Lee3, Bob Nagler3, Eric C. Galtier3, Jerome B. Hastings3, and Christian G. Schroer1 — 1DESY Photon Science, Notkestr. 85, 22607 Hamburg, Germany — 2Institute of Structural Physics, Technische Universität Dresden, 01062 Dresden, Germany — 3SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
The characterization of XFEL-nanobeams is often crucial for the correct interpretation of experimental results. To date, this step was primarily implemented by imprint techniques giving rather rudimentary postmortem information of the intensity distribution. In this contribution, we present results obtained by scanning coherent x-ray microscopy (ptychography) during different beamtimes at the MEC- and XPP-instrument of the LCLS. This method has the advantage that the full caustic of the nanofocused beam can be numerically retrieved yielding the complete information on the focused XFEL-beam. Additionally, the retrieved complex-valued wave field could be refined for individual XFEL-pulses.
In the future, we are planning to implement the technique as a real-time diagnostic to spatially characterize XFEL-nanobeams and a first step towards this goal was conducted by implementing a fast detector for the measurement of the diffraction patterns. In combination with fast data processing routines running on GPU's a real-time visualization of nanofocused XFEL-beams is within reach.