Berlin 2015 – scientific programme
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MI: Fachverband Mikrosonden
MI 7: X-ray Imaging, Tomography and X-ray Optics
MI 7.2: Talk
Wednesday, March 18, 2015, 09:45–10:00, EMH 225
Multi plane probe retrieval in X-ray nearfield imaging — •Johannes Hagemann1, Anna-Lena Robisch1, David Russell Luke2, Carolin Homann2, Thorsten Hohage2, Peter Cloetens3, and Tim Salditt1 — 1Institute for X-Ray physics, G. A. U. Göttingen — 2Institute for Numerical and Applied Mathematics, G. A. U. Göttingen — 3European Synchrotron Radiation Facility
The probe, i.e. the impinging X-ray beam on the sample, is the main actor in X-ray imaging experiments when it comes to image quality. Knowledge about the probe helps to characterize the optics in use and to circumvent problems associated with the standard flat field correction. Additionally we can characterize beam properties as the degree of coherence or the size of the focal spot. We present reconstructions of the probes of different ESRF beamlines (ID16, ID19, ID22) which were used for X-ray imaging experiments. Gaining information about the probe is an example of the phase retrieval problem which is solved here by multiple detector plane positions [1]. This experimental scheme yields reconstructions without using an additional test sample.
[1] Hagemann, J. et al. Opt. Express 22, 11552 (2014)