MI 7: X-ray Imaging, Tomography and X-ray Optics
Mittwoch, 18. März 2015, 09:30–10:45, EMH 225
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09:30 |
MI 7.1 |
XFEL nanobeam characterization by scanning coherent x-ray microscopy — •Andreas Schropp, Robert Hoppe, Jens Patommel, Frank Seiboth, Hae Ja Lee, Bob Nagler, Eric C. Galtier, Jerome B. Hastings, and Christian G. Schroer
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09:45 |
MI 7.2 |
Multi plane probe retrieval in X-ray nearfield imaging — •Johannes Hagemann, Anna-Lena Robisch, David Russell Luke, Carolin Homann, Thorsten Hohage, Peter Cloetens, and Tim Salditt
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10:00 |
MI 7.3 |
Cone Beam X-Ray Imaging and Tomography with Anisotropic Source Sizes — •Malte Vassholz and Tim Salditt
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10:15 |
MI 7.4 |
Lithographically fabricated waveguides for x-ray coherent imaging — •Sarah Hoffmann, Hsin-Yi Chen, Henrike Neubauer, Mike Kanbach, and Tim Salditt
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10:30 |
MI 7.5 |
Refraktive Röntgenlinsen aus Lamellen konstanter Dicke — •Jens Patommel, Frank Seiboth, Maria Scholz, Robert Hoppe, Felix Wittwer, Juliane Reinhardt, Jens Seidel, Martin Knaut, Andreas Jahn, Karola Richter, Johann W. Bartha, Gerald Falkenberg und Christian G. Schroer
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