Berlin 2015 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 13: Microstructure and Phase Transformations III
MM 13.1: Talk
Monday, March 16, 2015, 15:45–16:00, H 0106
X-ray nanodiffraction with in situ load and pressure — •Christina Krywka1, Angelika Zeilinger2, Jozef Keckes2, and Martin Müller1 — 1Helmholtz-Zentrum Geesthacht, Max-Planck-Straße 1, Geesthacht D-21502 — 2Montan-Universität Leoben, Dep. Materialphysik, Jahnstraße 12/I, A-8700 Leoben
Scanning X-ray nanodiffraction (SXND) is an excellent tool for materials science. It readily serves structural information with sub-micrometer spatial resolution from crystalline and semi-crystalline materials, suitable to retrieve residual stress microprofiles or crystal structure. Provided a sufficiently high energy and long focal distance, SXND experiments can be performed on metallic samples and in extended sample environments, making SXND of course a highly desirable method for materials science.
SXND experiments were performed with a beam size of 350 nm * 250 nm with in situ high pressure application and with in situ nanoindentation, using homebuilt sample environments and the conditions at the Nanofocus Endstation of beamline P03 (PETRA III, Hamburg). A hydrostatic pressure cell was used in combination with a 19 keV nanobeam for the first time in order to record spatially resolved data from a fractured silver sample at (truly isotropic) hydrostatic conditions below 1 GPa. The nanoindentation setup on the other hand was used to apply directed strains of similar magnitude onto microstructured Ti-Al hard coatings at 15 keV in order to observe processes inducing fracture of the coating.