Berlin 2015 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 17: Postersession I

MM 17.13: Poster

Monday, March 16, 2015, 18:00–20:00, Poster E

Resolution analysis of Transmission Kikuchi Diffraction (TKD) patterns in SEM — •Dennis Langenkämper, Martin Peterlechner, and Gerhard Wilde — Institut für Materialphysik, WWU Münster

Since the first commercial systems appeared in the early 1990s, electron back-scatter diffraction (EBSD) has grown into one of the most common techniques to characterize the microstructure of crystalline samples. Due to its ease and vast range of applicability to materials in the submicrometer grain size range, EBSD is a widely spread method to analyze deformation structures and mixtures of phases.

Current research focuses on nanoscaled materials, which may show drastic changes in properties with often superior results. Thus, there is a strong need to enhance the spatial resolution of EBSD. Transmission Kikuchi Diffraction (TKD) is a suitable method to overcome limits of EBSD by using thin samples transparent to the electron beam.

The present work focuses on the resolution limits, using a conventional EBSD detector (EDAX) and a custom-build TKD sample holder to study the influence of experimental conditions (sample thickness, sample material) on the resolution limit of TKD.