Berlin 2015 –
wissenschaftliches Programm
O 101: Scanning Probe Techniques: AFM
Freitag, 20. März 2015, 10:30–12:45, MA 144
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10:30 |
O 101.1 |
Probing higher force gradients with Atomic Force Microscopy on the graphene surface — •Daniel Meuer, Thomas Hofmann, Alfred John Weymouth, Andrea Donarini, and Franz Josef Giessibl
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10:45 |
O 101.2 |
Information in multifrequency AFM data — •Daniel Platz, Daniel Forchheimer, Erik A. Tholén, John E. Sader, and David B. Haviland
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11:00 |
O 101.3 |
High Resolution at High Viscosity - Dynamic Force Microscopy at Low Q-Factors — •Stefan Weber, Jason Kilpatrick, Timothy Brosnan, Victor Bergmann, Suzanne Jarvis, and Brian Rodriguez
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11:15 |
O 101.4 |
A sophisticated Feedback Control algorithm for High-Speed AFM — •Anne-D. Mueller and Falk Mueller
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11:30 |
O 101.5 |
Capillary force acting on a particle correlated with the shape of the meniscus — •Frank Schellenberger, Periklis Papadopoulos, Stefan Weber, Michael Kappl, Doris Vollmer, and Hans-Jürgen Butt
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11:45 |
O 101.6 |
The contact charging of insulators by atomic force microscopy — •Monika Mirkowska, Markus Kratzer, Stefan Klima, Helmut Flachberger, and Christian Teichert
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12:00 |
O 101.7 |
The Meaning of Temperature in Interferometric Detection Schemes — •Alexander Schwarz, Gotthold Fläschner, Kai Ruschmeier, Roland Wiesendanger, Reza Bakhtiari, and Michael Thorwart
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12:15 |
O 101.8 |
Dynamic Friction Force Microscopy at Surface Defects on HOPG — •Felix Mertens, Thomas Göddenhenrich, and André Schirmeisen
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12:30 |
O 101.9 |
A Closer Look into Operating Perovskite-Sensitized Solar Cells — •Stefan Weber, Victor Bergmann, Javier Ramos, Mohammad Nazeeruddin, Michael Graetzel, Shazada Ahmad, and Ruediger Berger
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