Berlin 2015 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 101: Scanning Probe Techniques: AFM

O 101.8: Vortrag

Freitag, 20. März 2015, 12:15–12:30, MA 144

Dynamic Friction Force Microscopy at Surface Defects on HOPG — •Felix Mertens, Thomas Göddenhenrich, and André Schirmeisen — Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392 Gießen

Dynamic friction force microscopy is a valuable scanning probe technique for the detection of friction properties on the nanometer scale. An off-resonance modulation of a sample surface induces non-linear cantilever bending oscillations, where the resonance response is a very sensitive measure of the interaction at the tip-sample contact. Images reveal surface steps and grain boundaries on graphite surfaces. The dynamic response furthermore contains information about elastic properties of surface steps. A signal pulse is applied to the modulation piezo and a fast Fourier transform of the cantilever real-time oscillation exhibits resonance parameters of the oscillation.