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O: Fachverband Oberflächenphysik

O 15: Scanning Probe Techniques: STM/AFM

O 15.3: Vortrag

Montag, 16. März 2015, 15:30–15:45, MA 043

Atomic-scale dissipation in atomic force microscopy imaging of TlBiSe₂ — •Florian Pielmeier, Julian Berwanger, and Franz J. Giessibl — Institut für Experimentelle und Angewandte Physik der Universität Regensburg, 93053 Regensburg, Deutschland

The surface termination of cleaved TlBiSe₂(111) was recently studied by scanning tunneling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) [1,2]. Both methods revealed the unusual termination of the surface which is composed of hexagonally ordered Tl islands. Besides the atomic resolution in the frequency shift signal of our cantilever we also observe a distinct atomic-scale dissipation signal on the order of 10 meV/cycle. The dissipation is reduced at the atomic sites which are surrounded by a ring of increased dissipation. We attribute the ring-like structure of the dissipation pattern to lateral jumps of the weakly bonded Tl atoms of the surface. [1] K. Kuroda et al., Phys. Rev. B 88, 245308 (2013), [2] F. Pielmeier et al., submitted.