Berlin 2015 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 15: Scanning Probe Techniques: STM/AFM

O 15.6: Vortrag

Montag, 16. März 2015, 16:15–16:30, MA 043

Chemical identification of atoms in an organic molecule using high-resolution atomic force microscopy — •Nadine Jacoba van der Heijden¹, Prokop Hapala², Jeroen Rombouts³, Joost van der Lit¹, Pingo Mutombo², Pavel Jelinek², and Ingmar Swart¹ — ¹Condensed Matter and Interfaces, Utrecht University, The Netherlands — ²Institute of Physics of the Czech Academy of Science, Prague, Czech Republic — ³VU University, Amsterdam, The Netherlands

Scanning probe techniques, such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM), can provide detailed information about the geometric and electronic structure of surfaces and molecules with atomic spatial resolution. However, current methods lack one important capability essential to realize the full potential of these techniques in molecular electronics and chemistry: sensitivity towards element, valence and functional group.

Here, we show that AFM combined with force-distance spectroscopy (FDS) and theoretical calculations can be used to achieve this goal. The central idea is that the force versus distance spectra dependend on the chemical nature of the atom atop of which the spectrum is acquired. By acquiring a 3D force grid over a model molecule, we demonstrate that chemical sensitivity can indeed be obtained.