Berlin 2015 – scientific programme

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O: Fachverband Oberflächenphysik

O 18: Focus Session: Structure, Chemistry, and Ion Solvation at Solid-Liquid Interfaces I

O 18.4: Topical Talk

Tuesday, March 17, 2015, 11:30–12:00, HE 101

Using resonant inelastic soft x-ray scattering maps to study liquids, gases, and their interfaces — •Lothar Weinhardt — IPS, Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen, Germany — ANKA Synchr. Radiation Facility, KIT, Eggenstein-Leopoldshafen, Germany — Dep. of Chem., University of Nevada, Las Vegas, U.S.A. — ITCP, KIT, Karlsruhe, Germany

X-ray emission spectroscopy (XES) and Resonant Inelastic X-ray Scattering (RIXS) have recently been applied to study liquid and gaseous systems. Such experiments became possible with new specialized experimental setups and given a unique insight into the electronic and vibrational structure of these systems. In this way, information on solvent/solute interactions, hydrogen bonding, molecular symmetries, excited-state dynamics, and many other aspects could be gathered. Finally, interfaces between solids and a gas/liquid can be studied in an in-situ fashion, which is of particular relevance for a wide range of applied systems including catalysis, electrochemistry, or the influence of environmental conditions on surfaces. In this presentation, we will report on our recent progress on studying such systems using XES and RIXS. By the development of a high-transmission soft x-ray spectroscopy setup we are able to measure complete Resonant Inelastic soft X-ray Scattering (RIXS) maps. These maps give a comprehensive picture of the electronic structure of occupied as well as unoccupied electronic states of the studied system. We will demonstrate the power of this approach by discussing the results obtained on selected liquids, gases, solutions, as well as gas/solid- and liquid/solid interfaces.