Berlin 2015 – scientific programme

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O: Fachverband Oberflächenphysik

O 29: Near-Field Microscopy

O 29.2: Talk

Tuesday, March 17, 2015, 14:15–14:30, MA 042

New Directions in Tip-Enhanced Near-Field Optical Microscopy — •Julia Janik, Nina Mauser, and Achim Hartschuh — Department Chemie and CeNS, LMU München, Germany

The characterisation of nanostructures with high spatial resolution and detection sensitivity can be achieved by tip-enhanced near-field optical microscopy (TENOM)[1]. We report on our efforts to extend this method into further directions. One direction is the application of tip-enhancement to photovoltaic and light-emitting devices as suggested in [2]. We obtained the first high-resolution photocurrent images of carbon nanotube devices using a metal tip to locally enhance optical-to-electrical transduction [3]. We show that the efficiency of the reversed process leading to electroluminescence can be increased as well. We also implemented tip-enhanced near-field optical microscopy at low temperatures (~5 K) and present a new microscope design based on a solid immersion lens configuration providing very high collection angles and efficiencies.

We acknowledge Financial support by DFG, NIM and the ERC (New- NanoSpec).

[1] N. Mauser, A. Hartschuh, Tip-enhanced near-field optical microscopy, Chem. Soc. Rev. 43, 1248 (2014).

[2] P. Bharadwaj, B. Deutsch, L. Novotny, Optical Antennas, Adv. Opt. Photon. 1, 438 (2009).

[3] N. Mauser et al., Antenna-Enhanced Optoelectronic Probing of Carbon Nanotubes, Nano. Lett. 14, 3773 (2014).