Berlin 2015 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 29: Near-Field Microscopy

O 29.3: Vortrag

Dienstag, 17. März 2015, 14:30–14:45, MA 042

Excitation power dependence in tip-enhanced Raman spectroscopy — •Tobia Mancabelli, Xian Shi, and Achim Hartschuh — Department Chemie & CENS, Ludwig-Maximilians-University, Munich, Germany

Tip Enhanced Raman Spectroscopy (TERS) exploits the enhanced electric field in the proximity of an optical antenna to achieve nanometer spatial resolution and high detection sensitivity [1]. A recent report indicates a contribution of nonlinear Raman scattering in the case of extremely strong enhancement achieved within the nanogap formed by a silver tip on a silver substrate [2]. Recently, a new mechanism contributing to surface-enhanced Raman scattering based on dynamical backaction has been proposed [3]. We conducted power-dependent confocal and tip-enhanced measurements of the Raman G-band intensity of single carbon nanotubes deposited on different substrates to reveal possible contribution from stimulated Raman scattering and dynamical backaction. Financial support by the ERC (NEWNANOSPEC) and the DFG through the Nanosystems Initiative Munich (NIM) is gratefully acknowledged. [1] MAUSER N., HARTSCHUH A.; CHEM. SOC. REV.; 43, 1248, 2014. [2] ZAHNG R. ET AL.; NATURE 82, 498, 2013. [3] ROELLI P. ET AL.; ArXiv: 1407.1518v1 (2014).