Berlin 2015 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 29: Near-Field Microscopy
O 29.8: Vortrag
Dienstag, 17. März 2015, 15:45–16:00, MA 042
Adapting ultra-broadband Synchrotron Radiation Sources for nano-FTIR Spectroscopy — •Peter Hermann1, Arne Hoehl1, Bernd Kästner1, Piotr Patoka2, Georg Ulrich2, Jörg Feikes3, Markus Ries3, Tobias Goetsch3, Godehard Wüstefeld3, Burkhard Beckhoff1, Eckart Rühl2, and Gerhard Ulm1 — 1Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin — 2Physikalische und Theoretische Chemie, Institut für Chemie und Biochemie, Freie Universität Berlin, Takustraße 3, 14195 Berlin — 3Helmholtz-Zentrum Berlin (HZB), Albert-Einstein-Straße 15, 12489 Berlin
Near-field techniques such as infrared scanning near-field optical microscopy and nano-FTIR spectroscopy enable imaging and spectroscopic characterization of samples at the nanoscale. While for near-field imaging typically monochromatic light sources are required to map the chemical composition of the sample surface, near-field infrared spectroscopy requires sources with a broad emission spectrum. Successful nano-FTIR experiments utilizing ultra-broadband synchrotron radiation have been recently demonstrated by several groups. In order to exploit the full potential of this approach we report on the adaption of storage ring optics at the Metrology Light Source (MLS) reducing the size of the electron bunches in order to improve the spatial coherence of synchrotron radiation. In combination with appropriate spectral filters the sensitivity of synchrotron-based near-field spectroscopy can be increased significantly, thus enabling also the spectroscopic characterization of thin organic layers.