Berlin 2015 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 36: Plasmonics and Nanooptics
O 36.12: Poster
Dienstag, 17. März 2015, 18:15–21:00, Poster A
Micro-scale Imaging Ellipsometry on Single-crystalline Gold Flakes for Plasmonic Applications — •Peter Richter1, Ovidiu D. Gordan1, Muhammad Y. Bashouti2, Björn Hoffmann2, Thorsten Feichtner2, Ahmed M. Salaheldin3, Mirza Mačković4, Christel Dieker4, Erdmann Spiecker4, Silke Christiansen2,5, and Dietrich R. T. Zahn1 — 1Semiconductor Physics, Technische Universität Chemnitz, D-09107 Chemnitz — 2Max Planck Institute for the Science of Light, D-91058 Erlangen — 3Universität Erlangen-Nürnberg, Institute of Particle Technology, D-91058 Erlangen — 4Universität Erlangen-Nürnberg, Center for Nanoanalysis and Electron Microscopy (CENEM), D-91058 Erlangen — 5Helmholtz Centre Berlin for Materials and Energy, D-14109 Berlin
Micro-scale single-crystalline gold flakes were drop casted onto a silicon surface intended to be used as substrate material for the fabrication of nanostructured plasmonic devices. Using an Accurion nanofilm ep4 imaging ellipsometer with a 1 µm lateral resolution, we demonstrate that spectroscopic micro-ellipsometry measurements on the gold flakes are prominently suitable to investigate their crystal and surface quality. The spectra were acquired under a 50x microscope objective in a spectral range from 1.55 to 3.25 eV at multiple angles of incidence. The ellipsometric parameters Ψ and Δ were extracted only from a small region of interest positioned in the middle of the gold flake. An optical model was applied to assure the Kramers-Kronig consistency of the experimental data and to deliver reliable results for the dielectric function, which agrees well with previous literature reports.