Berlin 2015 – scientific programme

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O: Fachverband Oberflächenphysik

O 36: Plasmonics and Nanooptics

O 36.23: Poster

Tuesday, March 17, 2015, 18:15–21:00, Poster A

Tip-Enhanced and Confocal Scanning Photocurrent Microscopy on Graphene. — •Nicolas Coca Lopez, Tobia Mancabelli, Harald Budde, and Achim Hartschuh — Department Chemie and CeNS, LMU München, Germany.

Scanning photocurrent microscopy (SPCM) is a powerful tool to investigate the electronic properties of nanoscale devices such as carbon nanotube- or graphene-based field-effect transistors [1, 2]. However, due to the diffraction limit of propagating light, most SPCM measurements on graphene reported so far have been restricted to a spatial resolution of few hundred nanometers, making it impossible to optically characterize a device on the nanoscale. Tip-enhanced near-field optical microscopy (TENOM) overcomes this limit [3]. Exploiting the strong electromagnetic field enhancement in the vicinity of an illuminated metallic nanoparticle, the absorption, and hence, charge carrier generation in nearby photoactive materials is locally increased [4]. Here, we report on our last advances on the combination of SPCM and TENOM and our results regarding charge carrier generation and transport in graphene.

[1] Freitag, M. et al., Nano Lett. Vol. 7, No. 7, 2007 [2] Müller T. et al., Phys. Rev. B 79, 245430, 2009 [3] Mauser, N. et al., Chem. Soc. Rev., Vol. 43, No. 4, 2014 [4] Rauhut, N. et al., ACS Nano, Vol. 6, No. 7, 2012