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O: Fachverband Oberflächenphysik

O 36: Plasmonics and Nanooptics

O 36.7: Poster

Dienstag, 17. März 2015, 18:15–21:00, Poster A

Phase-tagged PEEM for localized surface plasmons — •Soo Hoon Chew¹, Sebastian Nobis¹, Alexander Gliserin¹, Peter Geisler², Michael Förster³, Yingying Yang⁴, Seungchul Kim⁵, Jürgen Schmidt¹, Matthias Kübel¹, Peter Hommelhoff³, Bert Hecht² und Ulf Kleineberg¹ — ¹Faculty of Physics, Ludwig Maximilian University of Munich, 85748 Garching, Germany — ²Institute of Physics, University of Würzburg, 97074 Würzburg, Germany — ³Department of Physics, University of Erlangen-Nuremberg, 91058 Erlangen, Germany — ⁴Institute of Semiconductors, Beijing 100083, P. R. China — ⁵Max Planck Center for Attosecond Science, Pohang, 790- 784, South Korea

Strong carrier-envelope phase (CEP) effects have been shown to be crucial in controlling electron motion recently in solids. As a further step, it is also very interesting to extend the CEP control on novel photonic devices. We have developed the single-shot phase-tagged time-of-flight photoelectron emission microscope (ToF-PEEM) with the aim to study localized surface plasmons in tailored plasmonic nanostructures. First, we use a CEP-sensitive nanotip to test the proof of principle of our setup. We also show some theoretical calculations of CEP effects on bowtie and dipole nanostructures with various gap sizes. The next experiments will be performed on single-crystalline gold nanostructures with ultralow surface roughness based on the theoretical prediction. The phase-tagged ToF-PEEM setup provides a versatile tool for both spatial-resolved and energy-resolved studies of attosecond control of electrons in tailored plasmonic nanostructures.