Berlin 2015 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 58: Electronic Structure of Surfaces II
O 58.5: Vortrag
Mittwoch, 18. März 2015, 16:00–16:15, MA 041
Simultaneous ARPES and transport measurements — •Lukasz Plucinski1, 2, Ewa Mlynczak1, Markus Eschbach1, and Claus M. Schneider1,2 — 1PGI-6, FZ Jülich, 52425 Jülich, Germany — 2Universität Duisburg-Essen, 47048 Duisburg, Germany
It is an open secret, that from the perspective of materials science, angle-resolved photoemission (ARPES) measurements are typically interpreted having in mind transport properties. Electrons measured in high resolution ARPES have kinetic energies for which the inelastic mean free path inside the crystal is in order of few atomic layers, therefore in practice ARPES probes at most a nanometer or two of the surface region of the sample. Spectral contribution from electronic states deeper inside the crystal is negligible. Yet, in "volume" samples, with each dimension larger than (to provide some number) 10 nm, it is the volume of the sample that typically has the dominant contribution to its transport properties. I will present first results of simultaneous ARPES and transport measurements on ultrathin, conducting films grown on insulating substrates and electrically contacted in situ under UHV. Furthermore, I will provide an overview of new exciting scientific avenues which will be opened up by this new approach.