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O: Fachverband Oberflächenphysik
O 64: New Methods
O 64.2: Poster
Wednesday, March 18, 2015, 18:15–21:00, Poster A
Space Charge Corrected Electron Momentum Microscope for Time-Resolved Hard X-ray Photoemission at the European XFEL — •Markus Scholz1, Gerd Schönhense2, Yves Acremann3, Katja Medjanik2, Nils Gerken1, and Wilfried Wurth1,4 — 1Physics Department and Center for Free-Electron Laser Science, Universität Hamburg, D-22761 Hamburg, Germany — 2Institut für Physik, Johannes Gutenberg-Universität, D-55099 Mainz, Germany — 3Department Physik, ETH Zürich, CH-8093 Zürich, Switzerland — 4DESY Photon Science, D-22607 Hamburg, Germany
Photoelectron spectroscopy at synchrotron radiation sources is a well-established technique to study static electronic properties of materials. To overcome limitations in information depth recently hard x-ray photoemission (HAXPES) has been developed as a powerful tool to study electronic structure of the bulk or of buried interfaces. With the new hard x-ray free-electron lasers time-resolved HAXPES will enable dynamic studies of bulk and interface electronic structure down to the femtosecond regime. We will set up a HAXPES endstation for European XFEL, which will be based on a novel electron momentum microscope. To utilize the high-brilliance and ultrashort pulses, we developed new strategies to minimize space-charge induced effects in photoelectron spectroscopy experiments. This project is funded by FSP 302 - FEL, 05K13GU3 and 05K13UM2.