O 79: Scanning Probe Techniques: STM
Donnerstag, 19. März 2015, 10:30–13:00, HE 101
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10:30 |
O 79.1 |
Landau quantization in graphite studied by STM in a 30 Tesla magnet — •Bas Hendriksen, Suruchi Singh, Wei Tao, Jan Gerritsen, Uli Zeitler, Peter Christianen, and Jan Kees Maan
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10:45 |
O 79.2 |
Determining absolute values of the critical Josephson current from Josephson STM experiments — •Berthold Jäck, Matthias Eltschka, Markus Etzkorn, Christian R. Ast, and Klaus Kern
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11:00 |
O 79.3 |
Laser induced charge dynamics at the GaAs(110) surface investigated with Scanning Tunneling Microscopy — •Philipp Kloth, Katharina Kaiser, Ole Bunjes, Terence Thias, and Martin Wenderoth
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11:15 |
O 79.4 |
A Self-Tracking Spectroscopic Method for Surface Photovoltage Measurements on Semiconducting Surfaces — •Kevin Oldenburg, Stefan Polei, Sylvia Speller, and Ingo Barke
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11:30 |
O 79.5 |
Hauptvortrag:
Spin Excitations and Correlations in Individual Molecules on Surfaces — •Markus Ternes
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12:00 |
O 79.6 |
Scanning Tunneling Potentiometry: Magnetotransport on the Atomic Scale — Philip Willke, •Thomas Kotzott, Anna Sinterhauf, and Martin Wenderoth
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12:15 |
O 79.7 |
Inelastic tunneling through a hydrogen molecule — •Matthias Stocker, Simon Röger, and Berndt Koslowski
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12:30 |
O 79.8 |
Role of the microscopic tip apex in STM-IETS measurements — Norio Okabayashi, Alexander Gustafsson, •Angelo Peronio, Magnus Paulsson, Toyoko Arai, and Franz J. Giessibl
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12:45 |
O 79.9 |
Tip radius quantification using feature size mapping of field ion microscopy images — •Sören Zint, Daniel Ebeling, Dirk Dietzel, Jens Falter, and André Schirmeisen
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