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O: Fachverband Oberflächenphysik

O 87: Graphene: Electronic Structure

O 87.13: Vortrag

Donnerstag, 19. März 2015, 18:00–18:15, MA 041

Ab initio calculation of XNLD in reflection of graphene — •Dominik Legut¹, Peter M. Oppeneer², Christine Jansing³, Marc F. Tesch^3,4, Markus Gilbert³, Andreas Gaupp³, Hans-Christoph Mertins³, Andrey Sokolov⁴, Suk-Ho Choi⁵, Hud Wahab⁶, Heiko Timmers⁶, and R.G. Elliman⁷ — ¹IT4Innovations Centre, VSB-TU Ostrava, Ostrava, Czech Republic — ²Department of Physics and Astronomy, Uppsala, Sweden — ³FH Münster, Steinfurt, Germany — ⁴HZB, Berlin, Germany — ⁵Department of Applied Physics, Kyung Hee University, Korea — ⁶University of New South Wales Canberra, Canberra BC, Australia — ⁷Department of Elect. Mat. Eng., Australian National University, Canberra, Australia

The reflection spectroscopy and in particular angular dependence of the x-ray natural linear dichroism (XNLD) were calculated on free standing monolayered graphene. The anisotropic XNLD was computed in the single electron picture within the framework of the DFT. The excitations stemming from carbon K-edge are considered. The spectral shape of the XNLD is compared with recorded data. The dependence of the reflection spectroscopy, here XNLD, based on the change of the electronic structure of bi-layer and tri-layered graphene is predicted.