Heidelberg 2015 – wissenschaftliches Programm

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A: Fachverband Atomphysik

A 26: Poster: Collisions, scattering and recombination

A 26.1: Poster

Mittwoch, 25. März 2015, 17:00–19:00, C/Foyer

Energy-dependent electron impact induced fluorescence relative cross-sections of neon — •Catmarna Küstner-Wetekam, Philipp Schmidt, Andreas Hans, Christian Ozga, André Knie, and Arno Ehresmann — Institut für Physik and Center for Interdisciplinary Nanostructure Science and Technology, Universität Kassel, Heinrich-Plett-Straße 40, 34132 Kassel, Germany

Electron impact induced ionization cross-sections of rare gases are needed in astrophysics and as benchmarks for theoretical calculations. Electron impact induced fluorescence spectroscopy (EIFS) has been used to determine relative partial fluorescence emission cross-sections of neon within the fluorescence wavelength range between 190 nm and 210 nm. The excitation energy was varied between 0.3 keV and 3.5 keV. The used experimental EIFS-setup [1] is shown and explained. Observed lines are assigned to transitions within NeII and NeIII and the results of the energy-dependent measurements are compared with published cross-sections [2,3] .

[1] A. Knie et al., J. Elec. Spec. Relat. Phenom., 185, 492-497 (2012)

[2] D. P. Almeida et al., J. Phys. B., 28, 3335-3345 (1995)

[3] B. L. Schram et al., Physica, 32, 185-196 (1966)